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Paper ID | SS-CIMM.10 | ||
Paper Title | JOINT ANOMALY DETECTION AND INPAINTING FOR MICROSCOPY IMAGES VIA DEEP SELF-SUPERVISED LEARNING | ||
Authors | Ling Huang, Deruo Cheng, Nanyang Technological University, Singapore; Xulei Yang, Institute for Infocomm Research (I2R), the Agency for Science, Technology and Research (A*STAR), Singapore; Tong Lin, Yiqiong Shi, Kaiyi Yang, Bah Hwee Gwee, Bihan Wen, Nanyang Technological University, Singapore | ||
Session | SS-CIMM: Special Session: Computational Imaging for Materials and Microscopy | ||
Time | Monday, 20 September, 13:30 - 15:00 | ||
Topic | Special Sessions: Computational Imaging for Materials and Microscopy | ||
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