2021 IEEE International Conference on Image Processing

19-22 September 2021 • Anchorage, Alaska, USA

Imaging Without Borders

2021 IEEE International Conference on Image Processing

19-22 September 2021 • Anchorage, Alaska, USA

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Paper Detail

Paper IDMLR-APPL-IVASR-1.4
Paper Title MASK GUIDED ATTENTION FOR FINE-GRAINED PATCHY IMAGE CLASSIFICATION
Authors Jun Wang, King's College London, United Kingdom; Xiaohan Yu, Yongsheng Gao, Griffith University, Australia
SessionMLR-APPL-IVASR-1: Machine learning for image and video analysis, synthesis, and retrieval 1
LocationArea D
Session Time:Monday, 20 September, 13:30 - 15:00
Presentation Time:Monday, 20 September, 13:30 - 15:00
Presentation Poster
Topic Applications of Machine Learning: Machine learning for image & video analysis, synthesis, and retrieval
IEEE Xplore Open Preview  Click here to view in IEEE Xplore
Abstract In this work, we present a novel mask guided attention (MGA) method for fine-grained patchy image classification. The key challenge of fine-grained patchy image classification lies in two folds, ultra-fine-grained inter-category variances among objects and very few data available for training. This motivates us to consider employing more useful supervision signal to train a discriminative model within limited training samples. Specifically, the proposed MGA integrates a pre-trained semantic segmentation model that produces auxiliary supervision signal, i.e., patchy attention mask, enabling a discriminative representation learning. The patchy attention mask drives the classifier to filter out the insignificant parts of images (e.g., common features between different categories), which enhances the robustness of MGA for the fine-grained patchy image classification. We verify the effectiveness of our method on three publicly available patchy image datasets. Experimental results demonstrate that our MGA method achieves superior performance on three datasets compared with the state-of-the-art methods. In addition, our ablation study shows that MGA improves the accuracy by 2.25% and 2% on the SoyCultivarVein and BtfPIS datasets, indicating its practicality towards solving the fine-grained patchy image classification.