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Paper Detail

Paper IDMLR-APPL-IP-8.5
Paper Title Unsupervised variability normalization for anomaly detection
Authors Aitor Artola, ENS Paris-Saclay, Université Paris-Saclay, France; Yannis Kolodziej, Visionairy, France; Jean-Michel Morel, Thibaud Ehret, ENS Paris-Saclay, Université Paris-Saclay, France
SessionMLR-APPL-IP-8: Machine learning for image processing 8
LocationArea E
Session Time:Wednesday, 22 September, 14:30 - 16:00
Presentation Time:Wednesday, 22 September, 14:30 - 16:00
Presentation Poster
Topic Applications of Machine Learning: Machine learning for image processing
IEEE Xplore Open Preview  Click here to view in IEEE Xplore
Abstract Anomaly detectors are necessary to automatize industrial quality control. However, crafting such detectors is difficult due to the complexity and variability of the object even when working only with rigid objects. We show that adding a deep learning normalization step as a preprocessing step to model based detectors allows for better and more robust detections. This self-supervised normalization neural network is trained on non-anomalous data only. The proposed preprocessing method, followed by an automatic detector, achieves state-of-the-art results on rigid objects from the MvTec dataset.