Technical Program

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Paper Detail

Paper IDSS-CIMM.8
Paper Title ROBUSTNESS OF TIME-RESOLVED MEASUREMENT TO UNKNOWN AND VARIABLE BEAM CURRENT IN PARTICLE BEAM MICROSCOPY
Authors Luisa Watkins, Sheila Seidel, Minxu Peng, Boston University, United States; Akshay Agarwal, Massachusetts Institute of Technology, United States; Christopher Yu, Charles Stark Draper Laboratory, United States; Vivek Goyal, Boston University, United States
SessionSS-CIMM: Special Session: Computational Imaging for Materials and Microscopy
TimeMonday, 20 September, 13:30 - 15:00
Topic Special Sessions: Computational Imaging for Materials and Microscopy
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