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Paper ID | SS-CIMM.8 | ||
Paper Title | ROBUSTNESS OF TIME-RESOLVED MEASUREMENT TO UNKNOWN AND VARIABLE BEAM CURRENT IN PARTICLE BEAM MICROSCOPY | ||
Authors | Luisa Watkins, Sheila Seidel, Minxu Peng, Boston University, United States; Akshay Agarwal, Massachusetts Institute of Technology, United States; Christopher Yu, Charles Stark Draper Laboratory, United States; Vivek Goyal, Boston University, United States | ||
Session | SS-CIMM: Special Session: Computational Imaging for Materials and Microscopy | ||
Time | Monday, 20 September, 13:30 - 15:00 | ||
Topic | Special Sessions: Computational Imaging for Materials and Microscopy | ||
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